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Bruker D8 DISCOVER
The Bruker D8 DISCOVER is a theta-theta X-ray diffraction system that is suitable for high angle high resolution diffractometry, low-angle X-ray reflectometry, and both bulk and thin film powder diffraction.
Source: Cu (Ka) radiation at 1.54 Angstroms
Incident beam optics: Single reflection graded parabolic mirror coupled into a two-reflection perfect crystal beam compressor
Goniometer: Theta-theta goniometer, minimum step size 0.0005°.
Sample stage: UMC 300 five-axis (x-y-z-χ-φ) precision sample stage, capable of handling 300mm wafers with full-wafer mapping
Diffracted beam optics: Bruker PATHFINDER (user-selected three-bounce Ge perfect crystal or motor-driven variable slit assembly)
Detector: Scintillation detector equipped with pulse-height analysis
Other capabilities: Integrated automatic absorber for extended dynamic range; variable knife-edge collimator for high resolution X-ray reflectometry; fully integrated with Bruker instrument control and evaluation software.
Typical applications: High resolution X-ray reflectometry for thin film structure (thickness, density, roughness); high resolution double- and triple-axis rocking curves of bulk and thin-film single crystal materials; triple axis reciprocal space mapping; polycrystalline thin film powder diffraction