World-Class Resources > Metrology Labs > Analytical & Characterization > Scintag X-ray Diffractometer (XRD)

Scintag X-ray Diffractometer (XRD)

Source: Cu (Ka) radiation at 1.54 Angstroms
Min. spot size 5 mm x 1 inch
Goniometer Resolution 0.02 deg
Detector: Peltier-cooled Si(Li) solid state detector
Samples can be powder, thin films or crystals

Typical applications: Structure and composition of thin films and powders